Physics Colloquium: Journey from the ‘Forest’ of Nanowires to the ‘Flatland’ of 2D Materials

Albert Davydov, Material Measurement Laboratory, National Institute of Standards and Technology

Abstract: Silicon whiskers were discovered in late 1950s and rediscovered in mid-90s. A single layer of graphite was discovered in 2004 (crowned with the 2010 Nobel prize) and followed by explosion of research on other 2D layered materials including MoS2 and related transition metal dichalcogenides.

Both of these breakthroughs led to exploration of fascinating properties of nanowires and atomically-thin layers, including quantum confinement, reduced density of structural defects, large active surface area, and functional flexibility for electronics, photonics, sensors and energy applications.

This seminar discusses our group research on fabrication, characterization and processing of semiconductor nanowires (NWs) into small-footprint chemical sensors, photodetectors, and Li-ion batteries. The design of NW platforms spans from ‘pick-n-place’ silicon and gallium nitride individual nanowire devices to vertically- and/or horizontally aligned periodic arrays towards wafer-scale device fabrication.

From the “forest” of nanowires, the talk will proceed to the “Flatland” of MoTe2, MoSe2, and other metal chalcogenide thin films, with the aim to benchmark their structural, optical and electrical properties and explore their potential application in “beyond CMOS” low-power, high-speed, and flexible electronics, and chem/bio-sensors.


Albert Davydov is a Staff Scientist at the National Institute for Standards and Technology (NIST).  He received his Ph.D. in Chemistry from Moscow State University (Russia) in 1989. He joined NIST fulltime in 2005 and is now active in the area of semiconducting thin films, nanowires and 2D materials. Dr. Davydov has more than 30 years of experience and over 100 publications with H-factor=32, related to growth of bulk crystals, deposition of thin films, and the fabrication, characterization, and processing of a wide range of nanostructured electronic materials. His expertise also includes thermodynamic modeling and experimental study of phase diagrams for metal and semiconductor material systems.

Davydov is a Leader of Functional Nanostructured Materials Group and a Project Leader on “Low-dimensional semiconductors for sensors, optoelectronics and energy applications” at Materials Science & Engineering Division at Material Metrology Laboratory at NIST. He also serves as a Head of the Semiconductor Task Group for the International Centre for Diffraction Data, co-Chair of the Reference Materials Task Group at ASTM Subcommittee on Compound Semiconductors, and co-Chair of SPIE Optics & Photonics Conference on Low-dimensional Materials and Devices

Tuesday, November 14, 2017 at 3:15pm

Regents Hall, 109
3700 O St. NW

Event Type



Georgetown College, Physics




Albert Davydov, NIST

Event Contact Name

Mak Paranjape

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